Exploring Feature Selection Scenarios for Deep Learning-based Side-channel Analysis.
Guilherme PerinLichao WuStjepan PicekPublished in: IACR Trans. Cryptogr. Hardw. Embed. Syst. (2022)
Keyphrases
- deep learning
- feature selection
- unsupervised learning
- machine learning
- unsupervised feature learning
- restricted boltzmann machine
- multi class
- mental models
- feature set
- feature extraction
- pattern recognition
- weakly supervised
- information retrieval
- deep architectures
- text classification
- dimensionality reduction
- model selection
- maximum likelihood
- semi supervised
- long range
- d objects
- support vector machine
- probabilistic model
- high dimensional
- feature space
- image segmentation