A novel RF self test for a combo SoC on digital ATE with multi-site applications.

Chun-Hsien Peng ChiaYu Yang Adonis Tsu Chung-Jin Tsai Yosen Chen C.-Y. Lin Kai Hong Kaipon Kao Paul C. P. Liang Chao Long Tsai Charles Chien H. C. Hwang

Published in: ITC (2014)

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