An Abnormal Negative Temperature Dependence of Erasestate Vt Retention Shift in 3-D NAND Flash Memories.
Y. H. LiuY. S. YangT. C. ZhanM. HuZ. J. LiuW. LinA. C. LiuY. C. HsuPublished in: IRPS (2022)
Keyphrases
- positive and negative
- long term
- anomaly detection
- cognitive load
- associative memory
- neural network
- information retrieval
- decision trees
- flash memory
- disk drives
- foreseeable future
- real time
- content addressable
- low power consumption
- room temperature
- tensor factorization
- storage devices
- low cost
- feature selection
- data sets