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Impact of Trapped Charge Vertical Loss and Lateral Migration on Lifetime Estimation of 3-D NAND Flash Memories.

Y. H. LiuT. C. ZhanY. S. YangC. C. HsuA. C. LiuW. Lin
Published in: IRPS (2023)
Keyphrases
  • information systems
  • information technology
  • estimation accuracy
  • data sets
  • neural network
  • artificial intelligence
  • least squares
  • maximum likelihood estimation