Steganalysis Based on Multiple Features Formed by Statistical Moments of Wavelet Characteristic Functions.
Guorong XuanYun Q. ShiJianjiong GaoDekun ZouChengyun YangZhenping ZhangPeiqi ChaiChunhua ChenWen ChenPublished in: Information Hiding (2005)
Keyphrases
- multiple features
- statistical moments
- data fusion
- feature extraction
- wavelet transform
- wavelet coefficients
- wavelet subbands
- feature set
- image retrieval
- metric learning
- feature vectors
- bit plane
- visual information
- incremental learning
- multiresolution
- multiscale
- multiple instance learning
- spatial domain
- low level features
- image compression
- denoising
- multi class
- image representation
- combining multiple
- high level