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Accurate On-Chip Linearity Monitoring With Low-Quality Test Signal Generation.
Matthias Wagner
Oliver Lang
Simon Dorrer
Esmaeil Kavousi Ghafi
Andreas Schwarz
Mario Huemer
Published in:
ISCAS (2023)
Keyphrases
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low quality
high quality
low cost
ground truth
signal processing
high speed
real time
multiscale
computational complexity
image registration
frequency domain
high frequency
monitoring system
analog vlsi
low quality images