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The Very Long Baseline Array.

Peter NapierDurgadas S. BagriBarry ClarkAlan E. E. RogersJonathan D. RomneyA. Richard ThompsonR. Craig Walker
Published in: Proc. IEEE (1994)
Keyphrases
  • error reduction
  • relative improvement
  • computer vision
  • three dimensional
  • expert systems
  • high speed
  • programmable logic
  • data mining