BEAM: A Computational Workflow System for Managing and Modeling Material Characterization Data in HPC Environments.
Eric J. LingerfeltAlex BelianinovEirik EndeveO. OvchinnikovSuhas SomnathJose M. BorregueroN. GrodowitzB. ParkRichard K. ArchibaldChristopher T. SymonsS. V. KalininO. E. Bronson MesserMallikarjun ShankarStephen JessePublished in: ICCS (2016)
Keyphrases
- data analysis
- synthetic data
- missing data
- data sources
- statistical analysis
- experimental data
- knowledge discovery
- computational power
- raw data
- sensor data
- original data
- data points
- database
- data structure
- training data
- data sets
- data quality
- fault tolerance
- high performance computing
- multimedia data
- network structure
- dynamic environments
- computer systems
- data warehouse
- image data
- xml documents