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The use of dARTMAP and fuzzy ARTMAP to solve the quality testing task in semiconductor industry.

Elena P. SapozhnikovaV. P. LuninL. LudwigWolfgang Rosenstiel
Published in: KES (1999)
Keyphrases
  • fuzzy artmap
  • incremental learning
  • test set
  • neural network
  • adaptive resonance theory
  • training patterns
  • data sets
  • machine learning
  • multi class