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Ablation Analysis for Multi-Device Deep Learning-Based Physical Side-Channel Analysis.

Lichao WuYoo-Seung WonDirmanto JapGuilherme PerinShivam BhasinStjepan Picek
Published in: IEEE Trans. Dependable Secur. Comput. (2024)
Keyphrases
  • deep learning
  • feature space
  • natural images
  • unsupervised learning