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Threshold Voltage Dependence on Bias for FinFET using Analytical Potential Model.
Hak-Kee Jung
Published in:
J. Inform. and Commun. Convergence Engineering (2010)
Keyphrases
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neural network
high level
prior knowledge
theoretical analysis
computational model
mathematical model
formal model
database
similarity measure
probability distribution
em algorithm
statistical model
experimental data
conceptual model
sensitivity analysis
neural network model