Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities.
Vinayak Bharat NaikJ. H. LimKazutaka YamaneJ. KwonBehin-Aein B.N. L. ChungS. KR. ChaoC. ChiangY. HuangL. PuYuichi OtaniSuk Hee JangNivetha BalasankaranWah-Peng NeoT. LingJia Wen TingH. YoonJ. MuellerB. PfefferlingO. KallenseeT. MerbethChim Seng SeetJ. WongY. S. YouS. SossT. H. ChanS. Y. SiahPublished in: IRPS (2022)