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Patterned Fabric Defect Detection using a Motif-Based Approach.

Henry Y. T. NganGrantham K. H. PangNelson Hon Ching Yung
Published in: ICIP (2) (2007)
Keyphrases
  • expert systems
  • database
  • dna sequences
  • multiscale
  • preprocessing
  • binding sites
  • motif discovery