Characterization and Architecture of Monolithic N⁺P-CMOS-SiPM Array for ToF Measurements.
A. EshkoliYael NemirovskyPublished in: IEEE Trans. Instrum. Meas. (2021)
Keyphrases
- time of flight
- analog vlsi
- focal plane
- infrared
- random access memory
- real time
- low cost
- design considerations
- software architecture
- analog to digital converter
- cmos image sensor
- management system
- low power
- image sensor
- single chip
- high speed
- systolic array
- neural network
- power consumption
- super resolution
- measurement noise
- linear array
- high quality
- image processing