Software defect prediction using static code metrics underestimates defect-proneness.

David Gray David Bowes Neil Davey Yi Sun Bruce Christianson

Published in: IJCNN (2010)

Keyphrases

software defect prediction
feature ranking
software metrics
software defect
ensemble learning
feature selection
class imbalance
imbalanced data
sample selection bias
source code
data sets
support vector machine
high dimensionality
generalization ability
text categorization
multi layer perceptron