Delay Uncertainty Reduction by Gate Splitting.

Vineet Agarwal Jin Sun Janet Meiling Wang

Published in: IEEE Trans. Circuits Syst. II Express Briefs (2009)

Keyphrases

incomplete information
uncertain data
critical path
real time
databases
data mining
machine learning
artificial neural networks
probability distribution
rough set theory
end to end
robust optimization
multiple input
loss probability
nano scale