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ESP: A System Utilization Benchmark.

Adrian T. WongLeonid OlikerWilliam T. C. KramerTeresa L. KaltzDavid H. Bailey
Published in: SC (2000)
Keyphrases
  • real world
  • wide range
  • databases
  • pattern recognition
  • comparative analysis
  • data mining
  • knowledge base
  • high level
  • high quality
  • multiscale
  • multiresolution
  • management system
  • computer assisted language learning