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A Compressive Sensing Assisted Massive SM-VBLAST System: Error Probability and Capacity Analysis.

Lixia XiaoPei XiaoZi Long LiuWenjuan YuHarald HaasLajos Hanzo
Published in: IEEE Trans. Wirel. Commun. (2020)
Keyphrases
  • compressive sensing
  • data analysis
  • error probability
  • nearest neighbor
  • image processing
  • pattern recognition
  • random projections