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Accelerated degradation-tests with tightened critical values.

Guangbin YangKai Yang
Published in: IEEE Trans. Reliab. (2002)
Keyphrases
  • machine learning
  • attribute values
  • wide range
  • user defined
  • learning algorithm
  • computer vision
  • relational databases
  • standard deviation
  • control parameters
  • continuous variables
  • test statistic