An Assessment of µ-Czochralski, Single-Grain Silicon Thin-Film Transistor Technology for Large-Area, Sensor and 3-D Electronic Integration.
Nitz SaputraMina DaneshAlessandro BaianoRyoichi IshiharaJohn R. LongNobuo KarakiSatoshi InouePublished in: IEEE J. Solid State Circuits (2008)