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Rohit Kapur, CTL for Test Information of Digital ICs Hardcover. Kluwer Academic Publisher, Boston, 2003. pp 173, plus XI, ISBN 1-4020-7293-7.
Mile K. Stojcev
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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information sources
prior knowledge
information processing
information sharing
temporal logic
spatial information
raw data
information overload
data sets
information systems
domain knowledge
end users
temporal information