Login / Signup

Micromachined probes for on-wafer measurement of millimeter- and submillimeter-wave devices and components.

Robert M. WeikleN. Scott BarkerArthur W. LichtenbergerMatthew F. Bauwens
Published in: GlobalSIP (2013)
Keyphrases
  • information systems
  • mobile devices
  • software components
  • embedded devices
  • database
  • information retrieval
  • software systems
  • intelligent environments
  • semiconductor manufacturing