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Study of a new electromigration failure mechanism by novel test structure.
L. D. Chen
B. L. Lin
M.-H. Hsieh
C. W. Chang
J. S. Tsai
J. C. Peng
C. C. Chiu
Y.-H. Lee
Published in:
IRPS (2015)
Keyphrases
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empirical studies
experimental design
website
simulation study
data mining
machine learning
decision making
decision trees
three dimensional
structural information
undergraduate students
selection mechanism