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Concurrency Defect Localization in Embedded Systems using Static Code Analysis: An Evaluation.
Bjarne Johansson
Alessandro Vittorio Papadopoulos
Thomas Nolte
Published in:
ISSRE Workshops (2019)
Keyphrases
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embedded systems
computing power
dynamic analysis
software systems
low cost
static analysis
resource limited
cooperative
artificial intelligence
relational databases
concurrency control
communication technologies
processing power