Login / Signup

Comparison of SRAM Cell Layout Topologies to Estimate Improvement in SER Robustness in 28FDSOI and 40 nm Technologies.

Anand IlakalAnuj Grover
Published in: VDAT (2017)
Keyphrases
  • significant improvement
  • website
  • emerging technologies
  • inter cell
  • artificial intelligence
  • search engine
  • computational efficiency
  • low power
  • layout design
  • stem cell