Allocation and analysis of reliability: multiple levels: system, subsystem, and module.

Norman F. Schneidewind

Published in: Innov. Syst. Softw. Eng. (2006)

Keyphrases

data analysis
three dimensional
wide range
artificial neural networks
real world
machine learning
computer vision
image processing
clustering algorithm
image sequences
bayesian networks
multi agent
search algorithm
pattern recognition
lower bound