Charge Loss Induced by Defects of Transition Layer in Charge-Trap 3D NAND Flash Memory.
Fei WangYuan LiXiaolei MaJiezhi ChenPublished in: IEEE Access (2021)
Keyphrases
- flash memory
- garbage collection
- solid state
- buffer management
- main memory
- file system
- disk drives
- data storage
- secondary storage
- embedded systems
- random access
- b tree
- database systems
- storage management
- storage devices
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- database
- data structure
- hand held devices
- small size
- database management systems
- multi dimensional
- low cost
- data mining