Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model.
Konstantin O. PetrosyantsLev M. SamburskyIgor A. KharitonovBoris G. LvovPublished in: J. Electron. Test. (2017)
Keyphrases
- simulation model
- agent model
- probability distribution
- statistical model
- conceptual model
- similarity measure
- expert systems
- probabilistic model
- management system
- mathematical model
- analytical model
- finite state machines
- mathematical models
- neural network model
- experimental data
- low cost
- video sequences
- objective function