Sign in
Impact Study of Layout-Dependent Effects Toward FinFET Combinational Standard Cell Optimization.
Heng Xu
Jun Wang
Hang Xu
Yi Gu
Hao Zhu
Qing-Qing Sun
David Wei Zhang
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2023)
Keyphrases
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positive effects
prior studies
optimization problems
optimization method
potential impact
databases
social networks
information systems
statistical analysis
optimization algorithm
statistically significant
optimization methods
individual differences
negative impact