Compact DSM MOSFET model and its parameters extraction.
Anatoly BelousVladislav NelayevSergey ShvedovViktor StempitskyTran Tuan TrungArkady TurtsevichPublished in: EWDTS (2011)
Keyphrases
- sensitivity analysis
- em algorithm
- measured data
- mathematical model
- parameter estimation
- cost function
- prior knowledge
- knowledge base
- neural network
- objective function
- input data
- maximum likelihood
- multiscale
- high level
- computational model
- theoretical framework
- statistical model
- formal model
- maximum likelihood estimation
- database