Deep F-Measure Maximization in Multi-label Classification: A Comparative Study.
Stijn DecubberThomas MortierKrzysztof DembczynskiWillem WaegemanPublished in: ECML/PKDD (1) (2018)
Keyphrases
- multi label classification
- multi label
- text classification
- semi supervised learning
- classification algorithm
- image annotation
- text categorization
- label space
- binary classification
- multi class
- image classification
- meta level
- binary classifiers
- semi supervised
- graph cuts
- unsupervised learning
- data sets
- upper bound
- knn
- reinforcement learning
- learning algorithm
- neural network