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Sensitivity-Based Modeling and Methodology for Full-Chip Substrate Noise Analysis.

Rajeev MurgaiSubodh M. ReddyTakashi MiyoshiTakeshi HorieMehdi Baradaran Tahoori
Published in: DATE (2004)
Keyphrases
  • data analysis
  • statistical analysis
  • database
  • low cost
  • data mining
  • case study
  • image analysis
  • evolutionary algorithm
  • noise reduction
  • noise level
  • additive noise
  • modeling framework
  • fuzzy cognitive maps
  • analog vlsi