Algorithm for Training Neural Networks on Resistive Device Arrays.
Tayfun GokmenWilfried HaenschPublished in: CoRR (2019)
Keyphrases
- neural network
- experimental evaluation
- learning algorithm
- times faster
- preprocessing
- high accuracy
- dynamic programming
- training phase
- training process
- pattern recognition
- detection algorithm
- significant improvement
- worst case
- computational cost
- theoretical analysis
- simulated annealing
- np hard
- cost function
- k means
- expectation maximization
- optimization algorithm
- training set
- matching algorithm
- neural network training
- feedforward neural networks
- feed forward neural networks
- genetic algorithm
- objective function
- recognition algorithm
- computational complexity
- energy function
- artificial neural networks
- hidden markov models
- probabilistic model
- data sets