Login / Signup

Effort-aware just-in-time defect prediction: simple unsupervised models could be better than supervised models.

Yibiao YangYuming ZhouJinping LiuYangyang ZhaoHongmin LuLei XuBaowen XuHareton Leung
Published in: SIGSOFT FSE (2016)
Keyphrases
  • case study
  • statistical models
  • data sets
  • semi supervised
  • metamodel
  • classification models
  • data mining
  • association rules
  • relational databases
  • prior knowledge
  • computer systems
  • experimental data
  • black box