Model selection for SOI MOSFET circuit simulation.
Jerry G. FossumSurya VeeraraghavanDan FitzpatrickPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)
Keyphrases
- model selection
- cross validation
- hyperparameters
- bayesian learning
- model selection criteria
- sample size
- feature selection
- meta learning
- generalization error
- statistical learning
- parameter estimation
- machine learning
- error estimation
- selection criterion
- regression model
- variable selection
- statistical inference
- mixture model
- parameter determination
- motion segmentation
- marginal likelihood
- gaussian process
- data mining
- automatic model selection
- bayesian methods
- maximum a posteriori
- bayesian information criterion
- leave one out cross validation