Login / Signup
Physics of Degradation in SiC MOSFETs Stressed by Overvoltage and Overcurrent Switching.
Joseph P. Kozak
Ruizhe Zhang
Jingcun Liu
Khai D. T. Ngo
Yuhao Zhang
Published in:
IRPS (2020)
Keyphrases
</>
power system
energy distribution
high frequency
non stationary
fundamental frequency
computer science
white noise
artificial intelligence
genetic algorithm
decision making
low voltage
artificial neural networks
wavelet transform
multiscale
high quality
low frequency
physical processes