Cluster based analytical method for the lot delivery forecast in semiconductor fab with wide product range.
Marcin MosinskiDaniel NoackFalk Stefan PappertOliver RoseWolfgang SchollPublished in: WSC (2011)
Keyphrases
- preprocessing
- wide range
- detection method
- experimental evaluation
- computational cost
- high precision
- high accuracy
- cost function
- prior knowledge
- pairwise
- long term
- classification accuracy
- clustering method
- synthetic data
- segmentation method
- fully automatic
- dynamic programming
- objective function
- model selection
- theoretical analysis
- artificial neural networks