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Analytical device modeling for MOS analog IC's based on regularization and Bayesian estimation.

Massimo ContiSimone OrcioniClaudio TurchettiGiovanni SonciniNicola Zorzi
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
  • bayesian estimation
  • blur identification
  • posterior distribution
  • regularization parameter
  • computer vision
  • missing data