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Analytical device modeling for MOS analog IC's based on regularization and Bayesian estimation.
Massimo Conti
Simone Orcioni
Claudio Turchetti
Giovanni Soncini
Nicola Zorzi
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1996)
Keyphrases
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bayesian estimation
blur identification
posterior distribution
regularization parameter
computer vision
missing data