Measurement Models for Psychological Attributes: by Klaas Sijtsma, and Andries L. van der Ark, Boca Raton, FL, CRC Press, Taylor & Francis Group, Chapman and Hall, 2020, 428 pp., 50 b/w illustrations, $79.95 (pbk), ISBN 978-0-367-42452-7.
Stan LipovetskyPublished in: Technometrics (2022)