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Measurement Models for Psychological Attributes: by Klaas Sijtsma, and Andries L. van der Ark, Boca Raton, FL, CRC Press, Taylor & Francis Group, Chapman and Hall, 2020, 428 pp., 50 b/w illustrations, $79.95 (pbk), ISBN 978-0-367-42452-7.

Stan Lipovetsky
Published in: Technometrics (2022)
Keyphrases
  • van der
  • probabilistic model
  • parameter estimation
  • mathematical models
  • computer vision
  • three dimensional
  • fuzzy logic
  • least squares
  • complex systems
  • data acquisition
  • modeling framework