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Exact Error Rate Analysis for Pulsed DS- and Hybrid DS/TH-CDMA in Nakagami Fading.

Mohammad Azizur RahmanShigenobu SasakiHisakazu KikuchiHiroshi HaradaShuzo Kato
Published in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2008)
Keyphrases
  • error rate
  • test set
  • misclassification rate
  • feature selection
  • multi class
  • rough sets
  • lower error rates