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4f fine-structure levels as the dominant error in the electronic structures of binary lanthanide oxides.
Bolong Huang
Published in:
J. Comput. Chem. (2016)
Keyphrases
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complex structures
structural analysis
metadata
spatial structure
structural properties
geometric structure
graph structure
field effect transistors
structural features
error analysis
prediction error
real time
error bounds
hierarchical structure
error rate
probabilistic model
artificial intelligence