A three-stage partial scan design method to ease ATPG.
Shang-E TaiDebashis BhattacharyaPublished in: J. Electron. Test. (1995)
Keyphrases
- significant improvement
- optimization algorithm
- high precision
- objective function
- cost function
- high accuracy
- case study
- evaluation method
- classification method
- segmentation method
- detection method
- computational cost
- experimental evaluation
- similarity measure
- data sets
- classification accuracy
- support vector machine
- support vector machine svm
- dynamic programming
- clustering method
- prior knowledge
- error rate
- user interface
- pairwise