On Generating Test Cases from EDT Specifications.

R. Venkatesh Ulka Shrotri Amey Zare Supriya Agrawal

Published in: ENASE (Selected Papers) (2015)

Keyphrases

euclidean distance transform
formal specification
functional requirements
delay insensitive
neural network
machine learning
binary images
control flow
databases
distributed systems
specification language
concurrent systems
learning technology standards