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Graph-based non-maximal suppression for detecting products on the rack.

Bikash SantraAvishek ShawDipti Prasad Mukherjee
Published in: Pattern Recognit. Lett. (2020)
Keyphrases
  • data sets
  • machine learning
  • semi supervised
  • automatic detection
  • travel time
  • product design
  • data center
  • graph model
  • product information
  • product line