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Fractional-N Digital PLL With a 0.2-ps Resolution ADC-Assisted Coarse/Fine-Conversion Chopping TDC and TDC Nonlinearity Calibration.

Chih-Wei YaoRonghua NiChung LauWanghua WuKunal GodboleYongrong ZuoSangsoo KoNam-Seog KimSangwook HanIkkyun JoJoonhee LeeJuyoung HanDaehyeon KwonChulho KimShinwoong KimSang Won SonThomas Byunghak Cho
Published in: IEEE J. Solid State Circuits (2017)
Keyphrases
  • coarse to fine
  • data conversion
  • multiresolution
  • database
  • mobile devices
  • high resolution
  • camera calibration
  • sigma delta