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Analytical Eye-Diagram Determination for the Efficient and Accurate Signal Integrity Verification of Single Interconnect Lines.
Dongchul Kim
Hyewon Kim
Yungseon Eo
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)
Keyphrases
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signal processing
high speed
database
multiresolution
cost effective
computational complexity
high resolution
image compression
transform domain
integrity verification