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Treatment of missing values for association rule-based tool commonality analysis in semiconductor manufacturing.

Rong-Huei ChenChih-Ming Fan
Published in: CASE (2012)
Keyphrases
  • missing values
  • missing data
  • semiconductor manufacturing
  • real time
  • missing data imputation
  • pattern recognition
  • expert systems
  • neural network
  • feature selection
  • domain knowledge
  • incomplete data