Device matching measurements in 28nm technology for high energy physics experiments.
Moataz ElkhayatStefano MangiarottiClaudio De BertiMarco GrassiPiero MalcovatiDomenico AlbanoAndrea BaschirottoPublished in: ICECS (2016)
Keyphrases
- high energy physics
- matching algorithm
- nm technology
- bitmap indices
- scientific data
- measurement data
- graph matching
- feature points
- object oriented
- shape matching
- power consumption
- computer vision
- image matching
- machine learning
- real time
- pattern matching
- multi dimensional
- pattern recognition
- data mining
- neural network