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A 13-Level SC DAC Achieving High Linearity With a Simple DEM for Wideband CT DSMs.

Hetong WangZhongxu ZhengKong-Pang Pun
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2023)
Keyphrases
  • achieving high
  • three dimensional
  • x ray
  • higher level
  • computed tomography