Similarity based ART 1 model for automatic die defect detection and classification.
Jyh-Yeong ChangWei-Lun ChangPublished in: SCIS&ISIS (2014)
Keyphrases
- computational model
- probabilistic model
- classification models
- pattern recognition
- classification scheme
- theoretical analysis
- image classification
- probability distribution
- social networks
- classification method
- mathematical model
- management system
- feature selection
- data sets
- cost function
- training set
- support vector machine svm
- machine learning algorithms
- training data
- high level
- classification algorithm
- image processing
- confidence scores